Year: 2014
Type: article
Abstract: This paper demonstrates a single-channel 10-bit 160 MS/s successive-approximation-register (SAR) analog-to-digital converter (ADC) in 65 nm CMOS process with a 1.2 V supply voltage. To achieve high speed, a new window-opening logic based on the asynchronous SAR algorithm is proposed to minimize the logic delay, and a partial set-and-down DAC with binary redundancy bits is presented to reduce the dynamic comparator offset and accelerate the DAC settling. Besides, a new bootstrapped switch with a pre-charge phase is adopted in the track and hold circuits to increase speed and reduce area. The presented ADC achieves 52.9 dB signal-to-noise distortion ratio and 65 dB spurious-free dynamic range measured with a 30 MHz input signal at 160 MHz clock. The power consumption is 9.5 mW and a core die area of 250 × 200 μm 2 is occupied.
Source: Journal of Semiconductors
Authors: Yuxiao Lu, Lu Sun, Zhe Li, Jianjun Zhou
Institution: Shanghai Jiao Tong University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1986304404