Work

Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

Year: 2006

Type: article

Source: Applied Surface Science

DOI: 10.1016/j.apsusc.2006.02.240

Authors: Bart Boschmans, Myriam Vanneste, Luc Ruys, Eef Temmerman, Christophe Leys, Luc Van Vaeck

Institutions: University of Antwerp, Centexbel, Ghent University

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W1986387488

FWCI: 0.483

Cites: 8

Cited by: 8

Related to: 10