Work

A statistical model of write-errors in bit patterned media

Year: 2012

Type: article

Source: Journal of Applied Physics

DOI: 10.1063/1.3691947

Authors: Josephat Kalezhi, Simon J. Greaves, Yasushi Kanai, Manfred E. Schabes, Michael Grobis, Jim J. Miles

Institutions: University of Manchester, Copperbelt University, Tohoku University, Niigata Institute of Technology, Hitachi Global Storage Technologies (United States)

Language: English

Topic: Magnetic properties of thin films

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: Engineering and Physical Sciences Research Council, Division of Electrical, Communications and Cyber Systems

Award: Nano-Patterned Storage Media: Noise and Density Limits

OpenAlex ID: W1986901249

FWCI: 0.951

Cites: 20

Cited by: 8

Related to: 10