XRD line profile analysis of tungsten thin films
Year: 2005
Type: article
Source: Vacuum
Authors: I. Djerdj, A.M. Tonejc, A. Tonejc, N. Radić
Institutions: University of Zagreb, Ruđer Bošković Institute
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1987199795