Work

Power supply noise simulation considering dynamic effect of on-chip current

Year: 2006

Type: conference-paper

Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

DOI: 10.1109/epep.2006.321198

Authors: Yaping Zhou, Sang Dhong, Yoichi Nishino, Paul Harvey, Rohan Mandrekar, Gilles Gervais, Nikki Criscolo

Institutions: IBM (United States), IBM Research - Austin, Sony Corporation (United States)

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1987761165

FWCI:

Cites: 4

Cited by: 5

Related to: 10