Work

Reliability of planar, Super-Junction and trench low voltage power MOSFETs

Year: 2010

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2010.07.042

Authors: A. Testa, S. De Caro, S. Panarello, S. Patanè, S. Russo, D. Patti, S. Poma, R. Letor

Institutions: University of Messina, STMicroelectronics (Italy)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1988554243

FWCI: 0.49

Cites: 7

Cited by: 12

Related to: 10