Work

Optical characterization of dislocation free Ge and GeOI wafers

Year: 2006

Type: article

Source: Materials Science in Semiconductor Processing

DOI: 10.1016/j.mssp.2006.08.035

Authors: Seref Kalem, I. Romandic, A. Theuwis

Institution: Umicore (Belgium)

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1990303218

FWCI: 0.545

Cites: 7

Cited by: 14

Related to: 10