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Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Year: 2005
Type: article
Abstract: X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa(2)Cu(3)O(7-delta) (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.
DOI: 10.1107/s0909049505006497
Authors: Tsuguhisa Sekioka, Kouichi Hayashi, Eiichiro Matsubara, Yukio Takahashi, Tetsutaro Hayashi, Mititaka Terasawa, Tohru Mitamura, Akihiro Iwase, Osamu Michikami
Institutions: University of Hyogo, Tohoku University, Institute for Materials Research, Tohoku University, Hyogo University, Osaka Prefecture University, Iwate University
Language: English
Subfield: Radiation
Open Access status: bronze
OpenAlex ID: W1990459160
FWCI: 1.35
Cites: 9
Cited by: 16
Related to: 10