Work

Scanning interferometric microscopy for the detection of ultrasmall phase shifts in condensed matter

Year: 2006

Type: article

Source: Physical Review A

DOI: 10.1103/physreva.73.021802

Authors: J. Hwang, M. M. Fejer, W. E. Moerner

Institution: Stanford University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1990493564

FWCI: 3.193

Cites: 29

Cited by: 25

Related to: 10