Work

Ask the Mutants: Mutating Faulty Programs for Fault Localization

Year: 2014

Type: conference-paper

Source: IEEE International Conference on Software Testing, Verification and Validation (ICST)

DOI: 10.1109/icst.2014.28

Authors: Seokhyeon Moon, Yunho Kim, Moonzoo Kim, Shin Yoo

Institutions: Korea Advanced Institute of Science and Technology, University of London, University College London

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1990785546

FWCI: 6.159

Cites: 37

Cited by: 315

Related to: 10