Work

Simulation and signal analysis of Akiyama probe applied to atomic force microscope

Year: 2013

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.2035726

Authors: Longlong Wang, Mingzhen Lu, Tong Guo, Sitian Gao, Huakun Zhang

Institutions: Tianjin University, National Institute of Metrology

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Key Technologies Research and Development Program

OpenAlex ID: W1990961553

FWCI: 1.335

Cites:

Cited by: 2

Related to: 10