Work

In-Situ Atomic Force Microscopy (AFM) Imaging: Influence of AFM Probe Geometry on Diffusion to Microscopic Surfaces

Year: 2008

Type: article

Source: Langmuir

DOI: 10.1021/la8003323

Authors: David P. Burt, Neil R. Wilson, Ulrich Janus, Julie V. Macpherson, Patrick R. Unwin

Institution: University of Warwick

Language: English

Topic: Electrochemical Analysis and Applications

Subfield: Electrochemistry

Field: Chemistry

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1992736251

FWCI: 1.17

Cites: 50

Cited by: 32

Related to: 10