Antireflective property of thin film a-Si solar cell structures with graded refractive index structure
Year: 2010
Type: article
Abstract: We report the antireflective property of thin film amorphous silicon (a-Si) solar cell structures based on graded refractive index structure together with theoretical analysis. Optimizations of the index profile are performed using the rigorous coupled-wave analysis method. The graded refractive index structure fabricated by oblique angle deposition suppresses optical reflection over a wide range of wavelength and incident angle, compared to the conventional structure. The average reflectance of thin film a-Si solar cell structure with the graded refractive index structure is suppressed by 54% at normal incidence due to the effective refractive index matching between ITO and a-Si, indicating a reasonable agreement with calculated results.
Source: Optics Express
DOI: 10.1364/oe.19.00a108
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,270
OpenAlex ID: W1992923972
