Work

CRISM scan system

Year: 2009

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.826115

Authors: Kim Strohbehn, Teck Choo, John Hayes, Gene Heyler, Jeff Lees, Dave Lohr, Gordon Seagrave

Institution: Johns Hopkins University

Language: English

Topic: Planetary Science and Exploration

Subfield: Space and Planetary Science

Field: Earth and Planetary Sciences

Domain: Physical Sciences

Open Access status: closed

Funder: National Institute of Standards and Technology

OpenAlex ID: W1995005578

FWCI: 3.515

Cites:

Cited by: 4

Related to: 10