Work

Characterization of leakage currents in long-lifetime capacitors

Year: 1986

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/t-ed.1986.22671

Authors: J. Oualid, A. Bouhdada

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1995077620

FWCI: 0.526

Cites: 7

Cited by: 6

Related to: 10