Work

Accurate automated non-resonant NRA depth profiling: Application to the low 3He concentration detection in UO2 and SiC

Year: 2007

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

DOI: 10.1016/j.nimb.2007.01.288

Authors: G. Martin, T. Sauvage, P. Desgardin, P. Garcia, G. Carlot, M.F. Barthe

Institutions: Centre National de la Recherche Scientifique, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Cadarache

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1995252577

FWCI: 1.898

Cites: 9

Cited by: 32

Related to: 10