Al2O3 and TiO2 Atomic Layer Deposition on Copper for Water Corrosion Resistance
Year: 2011
Type: article
DOI: 10.1021/am2009579
Authors: A. I. Abdulagatov, Y. Yan, J. R. Cooper, Y. Zhang, Z. M. Gibbs, A. S. Cavanagh, R. G. Yang, Y. C. Lee, S. M. George
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1995326391
