Work

The determination of the interface state density distribution of the Al/methyl red/p-Si Schottky barrier diode by using a capacitance method

Year: 2006

Type: article

Source: Physica B Condensed Matter

DOI: 10.1016/j.physb.2006.06.126

Authors: T. Kılıçoğlu, M.E. Aydın, Y.S. Ocak

Institution: Dicle University

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1996074034

FWCI: 3.816

Cites: 22

Cited by: 72

Related to: 10