Impact of Research on Defects in Silicon on the Microelectronic Industry
Year: 2000
Type: article
Source: physica status solidi (b)
Authors: W. Bergholz, D. Gilles
Institution: Infineon Technologies (Germany)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1996629700
