Work

Diode laser testing by taking advantage of its photoelectric properties

Year: 2002

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.462652

Authors: Jens W. Tomm, A. Gerhardt, Dirk Lorenzen, P. Henning, H. Roehle

Institutions: Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy, Jenoptik (Germany), Fraunhofer Institute for Telecommunications, Heinrich Hertz Institute

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: European Regional Development Fund

OpenAlex ID: W1997020005

FWCI: 1.126

Cites:

Cited by: 5

Related to: 10