Work

Symmetry analysis of the RHEED patterns from the Si(001)−2 × 1 surfaces

Year: 1995

Type: article

Source: Ultramicroscopy

DOI: 10.1016/0304-3991(95)00054-5

Authors: Y Ma, S Lordi, J.A Eades

Institution: University of Illinois Urbana-Champaign

Language: English

Topic: Surface and Thin Film Phenomena

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1997305249

FWCI: 0.212

Cites: 82

Cited by: 7

Related to: 10