Transmission electron microscopy and reflected high-energy electron-diffraction investigation of plastic relaxation in doped and undoped ZnSe/GaAs(001)
Year: 1996
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.361776
Institution: University of Regensburg
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1997376079