Optical Metrology, the Key to Lean Manufacturing
Year: 2012
Type: conference-paper
DOI: 10.4271/2012-01-0185
Authors: John Tyson, John Psilopoulos, Eric Schwartz, Konstantin Galanulis
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1997471620