Work

Relation between the tangent of the angle of dielectric losses and low drift mobility in dielectrics

Year: 1991

Type: article

Source: Philosophical Magazine B

DOI: 10.1080/13642819108207605

Authors: V. V. Bryksin, A. V. Goltsev And, S. D. Khanin

Institution: Ioffe Institute

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1998041364

FWCI:

Cites: 12

Cited by: 6

Related to: 10