Use of atomic force microscopy (AFM) to explore cell wall properties and response to stress in the yeast Saccharomyces cerevisiae
Year: 2013
Type: review
Source: Current Genetics
Institutions: Centre National de la Recherche Scientifique, Université Toulouse III - Paul Sabatier, Institut National des Sciences Appliquées de Toulouse, Institut National Polytechnique de Toulouse, Toulouse Biotechnology Institute, Bio & Chemical Engineering, Université de Toulouse, Laboratoire d'Analyse et d'Architecture des Systèmes
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1998177015