14.7 In-situ techniques for in-field sensing of NBTI degradation in an SRAM register file
Year: 2015
Type: conference-paper
Authors: Teng Yang, Doyun Kim, Peter R. Kinget, Mingoo Seok
Institution: Columbia University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1998246226