Work

Determination of minority-carrier diffusion length in indium phosphide by surface photovoltage measurement

Year: 1976

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.88966

Author: Sheng S. Li

Institution: University of Florida

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1998253102

FWCI: 1.399

Cites: 9

Cited by: 49

Related to: 10