Work

Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomography

Year: 2012

Type: article

Source: Applied Surface Science

DOI: 10.1016/j.apsusc.2012.07.108

Authors: T. Kinno, H. Akutsu, M. Tomita, S. Kawanaka, T. Sonehara, A. Hokazono, L. Renaud, I. Martin, R. Benbalagh, B. Sallé, S. Takeno

Institutions: Toshiba (Japan), Cameca (France)

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1998458482

FWCI: 1.871

Cites: 14

Cited by: 17

Related to: 10