Work

Use of Haun's scale for monitoring development of wheat from flag leaf emergence to end of stem elongation

Year: 1996

Type: article

Source: European Journal of Agronomy

DOI: 10.1016/s1161-0301(96)02014-x

Authors: C.E. Cabeza, A.G. Kin, P.M.K. Deblonde, J.F. Ledent

Institutions: Universidad Nacional de La Pampa, UCLouvain

Language: English

Topic: Wheat and Barley Genetics and Pathology

Subfield: Plant Science

Field: Agricultural and Biological Sciences

Domain: Life Sciences

SDG: Zero hunger

Open Access status: closed

OpenAlex ID: W1998607603

FWCI:

Cites: 20

Cited by: 3

Related to: 10