Reliability of Probe Measurements in Hot Cathode Gas Diodes
Year: 1952
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.1702342
Authors: Gottfried Wehner, Gustav Medicus
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1998630075