Work

Physical, structural and mechanical characterization of Ti1−xSixNy films

Year: 1998

Type: article

Source: Surface and Coatings Technology

DOI: 10.1016/s0257-8972(98)00620-3

Authors: F. Vaz, L. Rebouta, S. Ramos, M.F. da Silva, J.C. Soares

Institutions: University of Minho, University of Coimbra

Language: English

Topic: Metal and Thin Film Mechanics

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W1998735077

FWCI: 9.784

Cites: 20

Cited by: 86

Related to: 10