Work

Ellipsometric study of metal-organic chemically vapor deposited III–V semiconductor structures

Year: 1992

Type: article

Source: Thin Solid Films

DOI: 10.1016/0040-6090(92)90579-z

Authors: Samuel A. Alterovitz, Patricia A. Sekula-Moise, Robert M. Sieg, Mark N. Drotos, Nancy A. Bogner

Institutions: Glenn Research Center, Spire Corporation (United States), Cleveland State University

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1999762136

FWCI: 1.254

Cites: 10

Cited by: 3

Related to: 10