Work

Thickness dependence of structure in thin films of low-temperature silver selenide

Year: 1993

Type: article

Source: Ultramicroscopy

DOI: 10.1016/0304-3991(93)90236-q

Authors: John R. Günter, Paul Keusch

Institution: University of Zurich

Language: English

Topic: Phase-change materials and chalcogenides

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000414991

FWCI:

Cites: 34

Cited by: 41

Related to: 10