Work

On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy

Year: 2003

Type: article

Source: The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics

DOI: 10.1080/0141861021000020095

Authors: Sławomir Kret, Paweł Dłużewski, Piotr Dłużewski, Jean-Yves Laval

Institutions: Institute of Physics, Polish Academy of Sciences, Institute of Fundamental Technological Research, Centre National de la Recherche Scientifique, ESPCI Paris

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2000462258

FWCI: 0.489

Cites: 16

Cited by: 22

Related to: 10