Pre- and post-breakdown switching behaviour in ultrathin SiO2layers detected by C-AFM
Year: 2001
Type: article
Source: Nanotechnology
Authors: M Porti, X Blasco, M Nafría, X Aymerich, A Olbrich, B Ebersberger
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2000504774