Work

Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors

Year: 2011

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.3589371

Authors: Sungsik Lee, Khashayar Ghaffarzadeh, Arokia Nathan, John Robertson, Sanghun Jeon, Changjung Kim, I-Hun Song, U-In Chung

Institutions: London Centre for Nanotechnology, University College London, University of Cambridge

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000761836

FWCI: 11.05

Cites: 19

Cited by: 348

Related to: 10