Analyzing UV/Vis/NIR spectra with the single-layer model—Sputtered SnS thin films I: Space–time dependencies
Year: 2011
Type: article
Source: Thin Solid Films
Authors: A. Stadler, H.-J. Schimper, U. Brendel, D. Topa, A. Basch, H. Dittrich
Institutions: University of Salzburg, Lam Research (Austria)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2000795839