Work

Probing for answers in the characterisation of advanced III–V device structures

Year: 1993

Type: article

Source: III-Vs Review

DOI: 10.1016/0961-1290(93)90179-r

Authors: Derek K. Skinner, Alan V. Hetherington

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000809367

FWCI: 0.481

Cites:

Cited by: 1

Related to: 10