Deep-level transient spectroscopy in MOS structures with a dual-channel boxcar integrator and arbitrarily chosen gate-width–data analysis
Year: 1989
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/1.1140498
Authors: K. Dmowski, A. Jakubowski
Institution: Warsaw University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2000974883