Work

Architectural measures against radiation effects in multicore SoC for safety critical applications

Year: 2014

Type: conference-paper

Source: IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)

DOI: 10.1109/mwscas.2014.6908502

Authors: Oliver Sander, Falco Bapp, Timo Sandmann, Viet Vu Duy, Steffen Bahr, Jurgen Becker

Institution: Karlsruhe Institute of Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Bundesministerium für Bildung und Forschung

OpenAlex ID: W2000983789

FWCI:

Cites: 3

Cited by: 3

Related to: 10