Work

A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide

Year: 2015

Type: conference-paper

Source: IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)

DOI: 10.1109/imws-amp.2015.7325043

Authors: Zheng Liu, Lei Zhu, Qiong Sen Wu, Gao Biao Xiao

Institutions: Shanghai Jiao Tong University, University of Macau

Language: English

Topic: Microwave Engineering and Waveguides

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000996042

FWCI: 0.416

Cites: 12

Cited by: 2

Related to: 10