Year: 2010
Type: article
Authors: B. Faatz, N. Baboi, V. Ayvazyan, V. Balandin, W. Decking, S. Duesterer, H.-J. Eckoldt, J. Feldhaus, N. Golubeva, K. Honkavaara, M. Koerfer, T. Laarmann, A. Leuschner, L. Lilje, T. Limberg, D. Noelle, F. Obier, A. Petrov, E. Ploenjes, K. Rehlich, H. Schlarb, B. Schmidt, M. Schmitz, S. Schreiber, H. Schulte-Schrepping, J. Spengler, M. Staack, F. Tavella, K. Tiedtke, M. Tischer, R. Treusch, M. Vogt, A. Willner, J. Bahrdt, R. Follath, M. Gensch, K. Holldack, A. Meseck, R. Mitzner, M. Drescher, V. Miltchev, J. Rönsch-Schulenburg, J. Rossbach
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2001328471