Signal-to-noise ratio, contrast-to-noise ratio, and exposure time for imaging systems with photon-limited noise
Year: 2006
Type: article
Source: Optical Engineering
DOI: 10.1117/1.2205850
Authors: Robert L. Lucke, R. A. Kessel
Institution: United States Naval Research Laboratory
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2002132109