Work

SWIR HgCdTe 256x256 focal plane array technology at BAE Systems

Year: 2006

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.693201

Authors: A. Hairston, S. P. Tobin, M. Hutchins, J. Marciniec, J. Mullarkey, P. Norton, M. Gurnee, M. B. Reine

Institution: BAE Systems (United States)

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Eye Institute

OpenAlex ID: W2002142832

FWCI:

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