Work

Surface imaging microscope

Year: 2008

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.764959

Authors: Eric W. Rogala, Isaac N. Bankman

Institutions: Johns Hopkins University, Johns Hopkins University Applied Physics Laboratory

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Johns Hopkins University

OpenAlex ID: W2002158089

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