Work

High-sensitivity 25-μm microbolometer FPAs

Year: 2002

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.478857

Authors: Daniel F. Murphy, Michael Ray, Richard Wyles, James F. Asbrock, Nancy A. Lum, Jessica Wyles, C. Hewitt, Adam Kennedy, David Van Lue, John S. Anderson, Daryl Bradley, Richard Chin, Thomas Kostrzewa

Institution: Raytheon (United States)

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2003285548

FWCI: 1.877

Cites:

Cited by: 18

Related to: 10