Work

Response of Correlated Double Sampling CMOS Imager Circuit to Random Telegraph Signal Noise

Year: 2006

Type: conference-paper

Source: International Caribbean Conference on Devices, Circuits and Systems

DOI: 10.1109/iccdcs.2006.250845

Authors: C. Leyris, J-c. Vildeuil, F. Roy, F. Martinez, M. Valenza, A. Hoffmann

Institutions: STMicroelectronics (France), Université Montpellier 2

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2004173456

FWCI: 2.11

Cites: 20

Cited by: 19

Related to: 10