Work

Real-time studies of thin film growth: Measurement and analysis of X-ray growth oscillations beyond the anti-Bragg point

Year: 2009

Type: article

Source: The European Physical Journal Special Topics

DOI: 10.1140/epjst/e2009-00930-y

Authors: S. Kowarik, A. Gerlach, M. W. A Skoda, S. Sellner, F. Schreiber

Institutions: University of Oxford, University of Tübingen

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2004668143

FWCI: 1.698

Cites: 45

Cited by: 44

Related to: 10