Coaxial Impact-Collision Ion Scattering Spectroscopy and Time-of-Flight Elastic Recoil Detection Analysis for In Situ Monitoring of Surface Processes in Gas Phase Atmosphere
Year: 2001
Type: article
Abstract: Based on conventional coaxial impact-collision ion scattering spectroscopy (CAICISS) and time-of-flight elastic recoil detection analysis (TOF-ERDA), we have developed a novel ion scattering and recoiling spectrometer equipped with a differential pumping system for in situ monitoring of surface processes in gas phase atmosphere in the pressure regime up to 10-4 Torr. In order to demonstrate the performance of this apparatus, we have applied it to real-time monitoring of Ge thin film growth on a Si(001) surface in atomic hydrogen (H) atmosphere. The morphology of Ge thin films and H coverage on the growth front during the growth in H atmosphere were successfully observed.
DOI: 10.1143/jjap.40.l576
Institutions: The University of Osaka, Daegu University
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2005109545
