Work

Exchange bias on epitaxial Ni films due to ultrathin NiO layer

Year: 2005

Type: article

Source: The European Physical Journal B

DOI: 10.1140/epjb/e2005-00183-6

Authors: R. A. Lukaszew, M. Mitra, Z. Zhang, M. Yeadon

Institutions: University of Toledo, National University of Singapore, Institute of Materials Research and Engineering

Language: English

Topic: Magnetic properties of thin films

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2005145852

FWCI: 0.206

Cites: 19

Cited by: 12

Related to: 10